IM-7030T
Light probe, 8 x 12 in.
CMM
CRYSTA-APEX S574
CMM Scan ARM
FARO : Quantum M max 2.0m + LLP Blux P
Software Reverse Engineering
Recovering the design
Coating Thickness meter
Quality Control.
Venier Caliper
Quality Control.
Micrometer
Quality Control.
Vernier Height Gage
Quality Control.
Grinding
Quality Control.
Micro Scope (cut check)
Quality Control.
Cutting SQ-100
Quality Control.
Surface roughness
Quality Control.